Facilities:Ex-Situ Diagnostics

Ex-Situ Diagnostics

For ex-situ evaluation of plasma synthesized nanomaterials, LPN-PPPL scientists use Raman spectroscopy, Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and BET measurements for surface area determination in the Princeton Institute for the Science and Technology of Materials (PRISM) and by X-ray Photoelectron Spectroscopy (XPS) and other surface analytical techniques in Koel’s labs at PPPL and at Princeton University (Koel's lab at Princeton University).

Secondary Electron Microscope

Transmission Electron Microscope

X-Ray Diffractometer

Micro-Raman Spectroscopy

Atomic Force Microscopy